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Find Class Codes and Use Them in a Search?
TOPIC: Generally speaking, there are two approaches to locating test and evaluation information: the single or multiple database search. The single database approach allows you to take advantage of a database's unique characteristics. Inspec® (File 4) is a perfect example of a database with powerful additional indexing that enables you to find technical papers that deal with information on testing results. This database contains Classification Codes that identify each subfile and topics within the subfile.
For this example we want to locate the most current information on the test procedure "fault diagnosis" and telecommunications.
COMMAND SUMMARY
BEGIN 4
SELECT FAULT(W)DIAGNOSIS? AND UD=9999
HELP CODES 4
SELECT S1 AND CC=B6
TYPE S2/3/1
HOW TO...

1. BEGIN File 4, an all inclusive database for technical topics.
2. SELECT keyword(s) and limit the search using UD=9999.
UD= is the prefix for Update Code. To retrieve only those records from the most recent update to the database, enter SELECT UD=9999. |

?b 4
File 4:INSPEC 1983-2008/May W1
(c) 2008 Institution of Electrical Engineers
Set Items Description
--- ----- -----------
?s fault(w)diagnosis? and ud=9999
102845 FAULT
61001 DIAGNOSIS?
22117 FAULT(W)DIAGNOSIS?
13882 UD=9999
S1 39 FAULT(W)DIAGNOSIS? AND UD=9999 |

3. Using the HELP command, you can see the class codes available in the database to help focus the search to a specific topic.
Note that the coding is divided by specific subject areas, with individual topics listed for a subject.
For this topic we'll focus on Communications.
Note: Portions of the list are omitted from this display. |

?help codes 4
CODES for INSPEC (File 4)
Classification Codes are available in INSPEC to narrow to a topic
within a subfile. Each subfile (A, Physics; B, Electrical
Engineering and Electronics; C, Computers & Control; D, Information
Technology) has a different classification scheme, but each scheme
is hierarchical. The broadest classification is at the two digit
level, with increasing specificity with additional digits, e.g.,
CC=B8 Power systems & applications
CC=B8100 Power networks & systems
CC=B8110 Power systems
CC=B8110B Power system management, operation & economics
Please expand online using the two digit classification in order
to see more details of the classification system used in INSPEC
Section A: Physics
CC=A0 General
CC=A1 The physics of elementary particles & fields
CC=A2 Nuclear physics
CC=A3 Atomic & molecular physics
CC=A4 Classical areas of phenomenology
CC=A5 Fluids, plasmas & electric discharges
CC=A6 Condensed matter: structure, thermal & mechanical
CC=A7 Electron states in condensed matter
CC=A8 Cross-disciplinary physics & related areas of science
and Technology
CC=A9 Geophysics, astronomy & astrophysics
Section B: Electrical Engineering and Electronics
CC=B0 General topics, engineering mathematics & materials science
CC=B1 Circuit theory & circuits
CC=B2 Components, electron devices & materials
CC=B3 Magnetic & superconducting materials & devices
CC=B4 Optical materials & applications, electro-optics
CC=B5 Electromagnetic fields
CC=B6 Communications
CC=B7 Instrumentation & special applications
CC=B8 Power systems & applications
Section C: Computers & Control
CC=C0 General & management topics
CC=C1 Systems & control theory
. . . . |

4. SELECT Set 1 (S1) and the class code for communications to focus fault diagnosis to this area.
|

?s s1 and cc=b6
39 S1
990476 CC=B6
S2 9 S1 AND CC=B6 |

5. TYPE a record to make sure the search is on target. The title indicates this is an appropriate article.
This is a conference paper. Note the DOI. By clicking the DOI link, you can retrieve the entire paper if you have a subscription to IEEE.
Use Format 9 to see the complete record, including an informative abstract.
|

?t s2/3/1
2/3/1
DIALOG(R)File 4: INSPEC
(c) 2008 Institution of Electrical Engineers. All rights reserved.
10945460
Title: Distributed online simultaneous fault detection for
multiple sensors
Author Rajagopal, R.; XuanLong Nguyen; Ergen, S.C.; Varaiya, P.
Author Affiliation: Univ. of California, Berkeley, USA
Conference Title: 2008 International Conference on Information
Processing in Sensor Networks (IPSN 2008) p. 133-44
Publisher: IEEE , Piscataway, NJ, USA
Publication Date: 2008 Country of Publication: USA
ISBN: 978-0-7695-3157-4 Material Identity Number:
YXA8-1900-788
Conference Title: 2008 International Conference on Information
Processing in Sensor Networks (IPSN 2008)
Conference Date: 22-24 April 2008 Conference Location: St.
Louis, MO, USA
Item Identifier (DOI): 10.1109/IPSN.2008.41
Language: English
Subfile: B C
Copyright 2008, The Institution of Engineering and Technology |
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